제품

광학&비전검사기

카메라모듈 검사기
기타 산업 검사기

Single Lens
Lens Ass’y
Lens Flare
Lens Barrel
VCM-Lens Ass’y
Image Sensor
Camera Module Top
Camera Module 6-side
Bar Type Flash Lens
Single Type Flash Lens

카메라모듈 검사기

에스디옵틱스는 카메라모듈을 제작하는 각 공정에서 필요한 정밀 검사 장비를 제공합니다.단품 렌즈 검사부터 카메라모듈 완제품 검사까지 카메라모듈 제작 공정에서 필요한단계별 검사 설비를 모두 보유하고 있습니다.

에스디옵틱스는 카메라모듈을 제작하는 각 공정에서 필요한 정밀 검사 장비를 제공합니다.단품 렌즈 검사부터 카메라모듈 완제품 검사까지카메라모듈 제작 공정에서 필요한 단계별검사 설비를 모두 보유하고 있습니다.

카메라모듈 공정별 검사 장비 활용 현황

System	Inspection Area	Status
Single Lens Inspection System	렌즈의 상,하면	In Production
Lens Barrel Inspection System	바렐의 상,하,측면	In Production
Lens Ass’y Inspection System	렌즈 어세이 경통의 모든 렌즈의각각 상하면 바렐 의 상,하,측면 Iris 및 플레어	In Production
Lens Flare Inspection System	렌즈 어세이 경통의 모든 렌즈의각각 상하면 바렐 의 상,하,측면 Iris 및 플레어	In Production
VCM-Lean Ass’y Inspection system	IR필터의 상하면(AR/IR) 렌즈의 마지막면	In Production
IR Attach-VCM Ass’y Inspection System	VCM에 IR필터를 조립하고 IR필터의 상,하면과 렌즈의 마지막면을 검사하는 조립및 검사기	In Production

System	Inspection Area	Status
Image Sensor Inspection System	이미지센서의 유효면	In Production
IR Attached Image Sensor Inspection System	IR 필터의 상,하면과 이미지센서의 유효면	In Production

System	Inspection Area	Status
Camera Module 6-side Inspection System	6-surface of the camera module and FPCB	In Production

카메라모듈 공정별 AVI* 시장 현황(*AVI: Auto Vision Inspection)

Lens & Ass’y

Digital Optic Koren CNO Bangjoo Sekonix N2A Haesung JAESUNG

Lens Ass’y + IR
Attach & VCM

UBIS Bangjoo Haesung Mir Cam IM Jahwa Hisonic Optron

Camera Module

Foxconn SEMCO SEC LGIT Patron CAMSYS MCNEX Nanos NAMUGA Cowell CRESIN HNT

Mobile

SEC LG Apple ZTE HTC

Lens Inspection

SD OPTICS MGN Nextar KIT TI HIMS

Lens Barrel & Ass’yInspection

SD OPTICS

IR Attach + IR Filter +VCM Inspection

Sensor Inspection

VCM Inspection

IR Filter + VCM
Inspection

IR Filter + Sensor
Inspection

SD OPTICS

Camera Module AVI

SD OPTICS

에스디옵틱스 검사

Conventional Inspection

- Non-automated microscope

- Worker’s visual inspection

- Focus controlled manually by workers

- Different result by workers

- No automated vari-focus technology

- Workers’ condition causes inaccuracy and
poor repeatability

→ High overkill and underkill

- 3 shifts/day causes labor cost increase

- Poor productivity due to many overkill

- Underkill causes post-processing cost increase

- Impossible to set and maintain a clear
inspection criteria

- Limit of inspection result documentation

- Insufficient experienced worker

- High turnover due to difficult work condition

SD Optics Inspection System

- Vari-Focus vision basis

- Automation algorithm

- Automated interlayer analysis

- Result of interlayer analysis

- Excellent repeatability due to automation

- Different defect criteria by inspection field

- Detection of micron defect such as stain, etc.

- Production increase using auto inspection

- Minimize overkill using optimized algorithm

- Save post-processing cost by controlling underkill

- Inspection standardization

- One step inspection and defect analysis

- Inspection result database

- Production control by defect type

- Several machines control per person

Inspection
Method
Interlayer
Analysis
Inspection
Result
Productivity
Difference

Single Lens Inspection System

- Lens top/bottom side inspection- Particle, black/white dot, bubble, scratch, contamination, coating error inspection- Using the combination of multi illumination system

제품문의

Items	SD Optics	Remark
Min. Defect size	≤ 12um	Base on short side of defect
Detect defection type	Particle, Black dot, White dot, Bubble, Scratch, Contamination, Coating error	Inspection area : Lens top/bottom
Underkill	≤ 0.5%	- Base on mass production product 2,000ea
Overkill	≤ 2%	- Not including ±1 pixel size deviation, secondary contamination, Visual inspector error
Repeatability	97%	- Not including less than 30 gray value defect
Cycle Time	0.35 sec/ea.	- 180ea products/tray, Magazine to Magazine
Vision System	Top : 4M x 2 sets, Bottom : 4M x 2 sets	Option: Color camera, Dual Magazine
Pixel resolution	6.1um
FOV	12mm x 12mm
Light	Multi-light system	Designed by SD OPTICS
NG product	Marking
Tray loading	20 coating trays/magazine

Lens Ass’y Inspection System

- Lens top/bottom side, Barrel inspection- Particle, black/white dot, bubble, scratch, contamination, coating error inspection- Auto NG Sorting system

제품문의

Items	SD Optics	Remark
Min. Defect size	≤ 12um	Base on short side of defect
Detect defection type	Particle, Black dot, White dot, Bubble, Scratch, Contamination, Coating error,Barrel, and so on.	Inspection area : Lens top/bottom, Barrel top/bottom(Option : Barrel Side)
Underkill	≤ 1%	- Base on mass production product 2,000ea
Overkill	≤ 6%	- Not including ±1 pixel size deviation, secondary contamination, Visual inspector error
Repeatability	≥ 95%	- Not including less than 30 gray value defect
Cycle Time	2.0 sec/ea.	- 100ea products/tray, Magazine to Magazine
Vision System	Top : 4M x 2 sets, Bottom : 4M x 2 sets	Option 1) Barrel Side Inspection vision 2. Iris inspection vision(Check assembled of not) Option 2) Iris inspection vision (check if assembled or not)
Pixel resolution	6.1um
FOV	12mm x 12mm
Light	Multi-light system	Designed by SD OPTICS
NG product	Sorting
Tray loading	10 trays/magazine

Lens Flare Inspection System

- Lens top/bottom/side/inside of lens ass’y barrel- Iris inside of lens ass’y- Lens flare inspection- Auto NG Sorting system

제품문의

Items	SD Optics	Remark
Min. Defect size
Detect defection type	Flare
Underkill	≤ 0.6%	- Base on mass production product 2,000ea
Overkill	≤ 6%	- Not including ±1 pixel size deviation, secondary contamination, Visual inspector error
Repeatability	≥ 95%	- Not including less than 30 gray value defect
Cycle Time	2.3 sec/ea.	- 100ea products/tray, Magazine to Magazine
Vision System	Pre-focus vision 1 set	Pre-align vision system
Pixel resolution	Using customer’s Image sensor
FOV	-
Light	LED Array	Designed by SD OPTICS
NG product	Sorting
Tray loading	10 trays/magazine

Customer Image
Results Image

Lens Barrel Inspection System

- Barrel Top/Bottom/Side inspection, barrel inside inspection- Particle, dent, scratch, contamination, coating error- Using the combination of multi illumination system

제품문의

Items	SD Optics	Remark
Min. Defect size	20um	Base on short side of defect
Detect defection type	Particle, Dent, Scratch, Conramination, Coating error	Inspection area : Barrel Top/Bottom/Side, Barrel inside
Underkill	≤ 1%	- Base on mass production product 2,000ea
Overkill	≤ 6%	- Not including ±1 pixel size deviation, secondary contamination, Visual inspector error
Repeatability	≥ 95%	- Not including less than 30 gray value defect
Cycle Time	2.0 sec/ea.	- 100ea products/tray, Magazine to Magazine
Vision System	Bottom : 2M x 1 set, Side : 2M x 1 set Inside : 2M x 1 set, Top : 4M x 2 sets (color)
Pixel resolution	7.6um
FOV	14mm x 14mm
Light	Multi-light system	Designed by SD OPTICS
NG product	Sorting
Tray loading	10 trays/magazine

VCM-Lens Ass’y Inspection System

- IR Filter top/bottom & Lens top side inspection- Particle, black dot, white dot, bubble, scratch, contamination, coating error, bonding error- Using the combination of multi illumination system

제품문의

Items	SD Optics	Remark
Min. Defect size	≥ 15 um ≥ 15 um ≥ 30 um	IR filter AR side IR filter AR side Lens top side
Detect defection type	Particle, Black dot, White dot, Bubble, Scratch, Contamination, Coating error, Bonding error	Inspection area : IR Filter Top/Bottom & Lens top side
Underkill	≤ 0.2%	- Base on mass production product 2,000ea
Overkill	≤ 8%	- Not including ±1 pixel size deviation, secondary contamination, Visual inspector error
Repeatability	≥ 95%	- Not including less than 30 gray value defect
Cycle Time	0.9 sec/ea.	- Base on dual line concept
Vision System	4M x 1 set
Pixel resolution	6.1um
FOV	12mm x 12mm
Light	Multi-light system	Designed by SD OPTICS
NG product	Sorting
Tray loading	5 trays/magazine

Image Sensor Inspection System (Semi-auto)

- Effective area of image sensor inspection- Particle, contamination- Using the combination of multi illumination system

제품문의

Items	SD Optics	Remark
Min. Defect size	≥ 1 um
Detect defection type	Particle, contamination	Image sensor effective area
Underkill	≤ 0.5%	- Base on mass production product 2,000ea
Overkill	≤ 2%	- Not including ±1 pixel size deviation, secondary contamination, Visual inspector error
Repeatability	≥ 97%	- Not including less than 30 gray value defect
Cycle Time	1.5 sec/ea.	- Excluding the Loading/Unloading time by operator
Vision System	Top : 4M x 1 set
Pixel resolution	4.23um
FOV	10mm x 10mm
Light	Multi-light system	Designed by SD OPTICS
NG product	Manual (Cleaning by operator)	Using 20x Microscope
Tray loading	1 strip	Manual

Camera Module Top Side Inspection System

- Top side of camera module inspection- Particle, scratch, contamination, poron shift, FPCB, Connector- Using the combination of multi illumination system

제품문의

Items	SD Optics	Remark
Min. Defect size	≥ 50 um ≥ 150 um	Lens top Poron, FPCB, connector
Detect defection type	Particle, Scratch, Contamination Poron shift, FPCB, Connector	Inspection area : Module top side
Underkill	≤ 0.25%	- Base on mass production product 2,000ea
Overkill	≤ 5%	- Not including ±1 pixel size deviation, secondary contamination, Visual inspector error
Repeatability	≥ 97%	- Not including less than 30 gray value defect
Cycle Time	2.5 sec/ea.	- Excluding the Loading/Unloading time by operator
Vision System	Module top side : 4M x 2 sets
Pixel resolution	6.1 um / 11.4 um
FOV	12.5 x 12.5 / 23.2 x 23.2 (mm)
Light	Multi-light system	Designed by SD OPTICS
NG product	Sorting
Tray loading	1 tray	Loading/Unloading by operator

Camera Module 6-side Inspection System

- 6-surface of the camera module top/side/bottom inspection- Particle, scratch, contamination, poron shift, FPCB, Connector stiffener- Using the combination of multi illumination system

제품문의

Items	SD Optics	Remark
Min. Defect size	≥ 50 um ≥ 50 um	Lens top side Poron, FPCB, connector
Detect defection type	Particle, Scratch, Contamination Poron, FPCB, Connector stiffener	Inspection area : Module top/ Side/Bottom
Underkill	≤ 0.2%	- Base on mass production product 2,000ea
Overkill	≤ 5%	- Not including ±1 pixel size deviation, secondary contamination, Visual inspector error
Repeatability	≥ 97%	- Not including less than 30 gray value defect
Cycle Time	2.1 sec/ea.	- Base on Mass production product 5 LOTs (60 ea./Tray)
Vision System	5M x 9 sets	Color camera
Pixel resolution	3.8 um / 5.8 um
FOV	9.3 x 7.9 / 16.2 x 13.7 (mm)
Light	Multi-light system	Designed by SD OPTICS
NG product	Sorting
Tray loading	Magazine

Chipping on Barrel
Damages on Connector
Lens Scratch
Dent on Shield can
Lack of epoxy

Bar Type Flash Lens Inspection System

- Bar type flash lens top/bottom side inspection- Particle, black dot, white dot, scratch, contamination- Auto NG sorting system

제품문의

Items	SD Optics	Remark
Min. Defect size	≥ 30 um	Base on short side of defect
Detect defection type	Particle, Black dot, White dot, Scratch, Contamination	Inspection area : Lens Top, Bottom
Underkill	≤ 0.5%	- Base on mass production product 2,000ea
Overkill	≤ 2%	- Not including ±1 pixel size deviation, secondary contamination, Visual inspector error
Repeatability	≥ 97%	- Not including less than 30 gray value defect
Cycle Time	1.2 sec/ea.	- 32ea products/tray - Dual line concept
Vision System	Top: 4M x 2 sets, Bottom: 4M x 2 sets
Pixel resolution	6.1 um
FOV	12mm x 12mm
Light	Multi-light system	Designed by SD OPTICS
NG product	Sorting
Tray loading	Stack	40 tray at once

Single Type Flash Lens Inspection System

- Single type flash lens top/bottom and side inspection- Particle, black dot, white dot, scratch, contamination- Using the combination of multi illumination system

제품문의

Items	SD Optics	Remark
Min. Defect size	≥ 30 um	Base on short side of defect
Detect defection type	Particle, Black dot, White dot, Scratch, Contamination	Inspection area : Lens Top, Bottom, Side
Underkill	≤ 0.5%	- Base on mass production product 2,000ea
Overkill	≤ 3%	- Not including ±1 pixel size deviation, secondary contamination, Visual inspector error
Repeatability	≥ 95%	- Not including less than 30 gray value defect
Cycle Time	1.3 sec/ea.	- 60ea products/tray
Vision System	Top: 4M x 2 sets Bottom: 4M x 2 sets Side: 4M x 2 sets
Pixel resolution	6.1 um
FOV	12mm x 12mm
Light	Multi-light system	Designed by SD OPTICS
NG product	Sorting
Tray loading	Stack	40 tray at once

VR/AR Lens
Wire Bonding Vision
Multifunctional
LCD Driver IC
Mobile Display Defect
Mobile Display Micro

VR/AR Lens Inspection System

- VR/AR lens top/bottom and side inspection- Particle, black dot, white dot, bubble, scratch, contamination- Using the combination of multi illumination system- Auto NG sorting

제품문의

Items	SD Optics	Remark
Min. Defect size	≤ 50um
Detect defection type	Particle, Black dot, White dot, Bubble, Scratch, Contamination	Inspection area : Lens top/bottom
Underkill	≤ 0.5%	- Base on mass production product 2,000ea
Overkill	≤ 3%	- Not including ±1 pixel size deviation, secondary contamination, Visual inspector error
Repeatability	≥ 95%	- Not including less than 30 gray value defect
Cycle Time	4sec/ea	- 1 lens/tray
Vision System	Top : 25M x 2 sets, Bottom : 25M x 1 sets
Pixel resolution	13.1um
FOV	60mm x 60mm
Light	Multi-light system	Designed by SD OPTICS
NG product	Sorting
Tray loading	Stack

Wire Bonding Vision Inspection System

- Defect before and after wire bonding in module - Bumped ball size, ball interval, ball~edge interval length, scratch, chipping, defect - Defect Marking / Mapping

제품문의

Items	SD Optics	Remark
Min. Defect size	5um	Base on short side of defect
Detect defection type	Bumped Ball size, Ball Interval, Ball to Edge Interval length, scratch, Chipping, Defect
Underkill	≤ 1%	- Base on mass production product 2,000ea
Overkill	≤ 6%	- Not including ±1 pixel size deviation, secondary contamination, Visual inspector error
Repeatability	≥ 95%	- Not including less than 30 gray value defect
Cycle Time	0.75sec/ea
Vision System	Top : 4M 2sets	Base on dual line concept
Pixel resolution	1.6um
FOV	3.2mm x 3.2mm
Light	Multi-light system	Designed by SD OPTICS
NG product	Laser Marking
Tray loading	Magazine

Multifunctional Precision Measuring System

- Live 3D visual display - Auto-Focus, Multi focus, AIF Image function - SW package (Auto-measure, data management, create&edit, etc) - Lighting control for each illuminations

제품문의

Items	SD Optics	Remark
Stage moving range	500 x 350 x 100	XYZ, mm
WS Magnification	1.3 x
FOV (mm)	8.5 x 8.5
Scanning Depth	6.1 mm
Depth Resolution	19.2 um
Accuracy	± 10 um
Illumination	24 sector control system	SD in-house made

LCD Driver IC (Chip On Glass)Inspection System

- Acquisition High precision color image based on In-Focus color image- Acquisition of three illuminations images at the same location- Real-time Focusing Ability for LDI Inspection Surface

제품문의

Items	Description	Remark
Product	COG Upgrade
Size / Weight	1,640(W) x 1,300(D) x 2,360(H), 1.5 ton
Min. Defect Size	6μm
UPH	≥ 6,000 UPH	(4” tray, 3x33 array, Dual Illumination, defect rate 3%)
UPH	≥ 3,700 UPH	(2” tray, 2x20 array, Dual Illumination, defect rate 3%)
Detectability	Underkill ≤ 0.1% Overkill ≤ 1% Repeatability ≥ 95%

Dark area inspection

Coaxial Illumination

Bump illumination

Multi illumination

Mobile Display DefectMeasuring System

- Precision measuring defects in the interlayer of flat or curved display

제품문의

Items	Spec	Remark
WS Magnification	7.5 x
FOV (mm)	2.3 x 2.2
Scanning Depth	0.688mm
Depth Resolution	2.15um
Accuracy	± 5um	Scanning range 1.45mm
Measuring T/T	84 sec / 120 cut

Material(defect) transparency

Defect on Curved Surface

Mobile Display Micro CrackInspection System

- Detection of micro crack on the flat and curved display

제품문의

Items	Spec	Remark
WS Magnification	2.3 x
FOV (mm)	5.5 x 5.5
Scanning Depth	4.9mm
Depth Resolution	15.5um
Accuracy	± 6um	Scanning range 1.45mm
Measuring T/T	-	Depends on the required insp. spec

Detection of the crack on the curved surface