Products

Optical & Vision
Inspection System

Camera Module Inspection System

SD Optics provides precision inspection system required in each process of manufacturing camera modules.From single lens inspection to camera module finished production,We have optimum solution to each process inspection and its requirements.

SD Optics provides precision inspection system required in each process of manufacturing cameramodules. From single lens inspection to camera module finished production,We have optimum solution to each process inspection and its requirements.

Camera Module Vision Inspection System (By Process)

System Inspection Area Status
Single Lens Inspection System Lens top, bottom side inspection In Production
Lens Barrel Inspection System Lens barrel top, bottom side inspection In Production
Lens Ass’y Inspection System Lens ass’y each lens top, bottom side inspection Lens barrel top, bottom, side surface inspection Iris and flare inspection In Production
Lens Flare Inspection System
VCM-Lean Ass’y Inspection system IR filter top, bottom side inspection (AR/IR) Outer surface of the last lens inspection In Production
IR Attach-VCM Ass’y Inspection System Outer surface of the IR Filter top and bottom side inspection afterVCM and IR filter assembly In Production
System Inspection Area Status
Image Sensor Inspection System Effective area of image sensor inspection In Production
IR Attached Image Sensor Inspection System Effective area of image sensor and IR filter top and bottom side inspection In Production
System Inspection Area Status
Camera Module 6-side Inspection System 6-surface of the camera module and FPCB In Production

Camera Module AVI* Market(*AVI: Auto Vision Inspection)

Lens & Ass’y

Digital Optic Koren CNO Bangjoo Sekonix N2A Haesung JAESUNG

Lens Ass’y + IR
Attach & VCM

UBIS Bangjoo Haesung Mir Cam IM Jahwa Hisonic Optron

Camera Module

Foxconn SEMCO SEC LGIT Patron CAMSYS MCNEX Nanos NAMUGA Cowell CRESIN HNT

Mobile

SEC LG Apple ZTE HTC

Advantages of SD Optics Inspection System

Conventional Inspection

- Non-automated microscope

- Worker’s visual inspection

- Focus controlled manually by workers

- Different result by workers

- No automated vari-focus technology

- Workers’ condition causes inaccuracy and
       poor repeatability

→ High overkill and underkill

- 3 shifts/day causes labor cost increase

- Poor productivity due to many overkill

- Underkill causes post-processing cost increase

- Impossible to set and maintain a clear
       inspection criteria

- Limit of inspection result documentation

- Insufficient experienced worker

- High turnover due to difficult work condition

SD Optics Inspection System

- Vari-Focus vision basis

- Automation algorithm

- Automated interlayer analysis

- Result of interlayer analysis

- Excellent repeatability due to automation

- Different defect criteria by inspection field

- Detection of micron defect such as stain, etc.

- Production increase using auto inspection

- Minimize overkill using optimized algorithm

- Save post-processing cost by controlling underkill

- Inspection standardization

- One step inspection and defect analysis

- Inspection result database

- Production control by defect type

- Several machines control per person

  • Inspection
    Method

  • Interlayer
    Analysis

  • Inspection
    Result

  • Productivity

  • Difference

Single Lens Inspection System

- Lens top/bottom side inspection- Particle, black/white dot, bubble, scratch, contamination, coating error inspection- Using the combination of multi illumination system

Items SD Optics Remark
Min. Defect size ≤ 12um Base on short side of defect
Detect defection
type
Particle, Black dot, White dot, Bubble, Scratch,
Contamination, Coating error
Inspection area : Lens top/bottom
Underkill ≤ 0.5% - Base on mass production product 2,000ea
Overkill ≤ 2% - Not including +1 pixel size deviation, secondary
    contamination, Visual inspector error
Repeatability 97% - Not including less than 30 gray value defect
Cycle Time 0.35 sec/ea. - 180ea products/tray, Magazine to Magazine
Vision System Top : 4M x 2 sets Bottom : 4M x 2 sets Option: Color camera, Dual Magazine
Pixel resolution 6.1um
FOV 12mm x 12mm
Light Multi-light system Designed by SD OPTICS
NG product Marking
Tray loading 20 coating trays/magazine

Lens Ass’y Inspection System

- Lens top/bottom side, Barrel inspection- Particle, black/white dot, bubble, scratch, contamination, coating error inspection- Auto NG Sorting system

Items SD Optics Remark
Min. Defect size ≤ 12um Base on short side of defect
Detect defection
type
Particle, Black dot, White dot, Bubble, Scratch,
Contamination, Coating error,Barrel, and so on.
Inspection area : Lens top/bottom, Barrel
  top/bottom(Option : Barrel Side)
Underkill ≤ 1% - Base on mass production product 2,000ea
Overkill ≤ 6% - Not including +1 pixel size deviation, secondary
    contamination, Visual inspector error
Repeatability ≥ 95% - Not including less than 30 gray value defect
Cycle Time 2.0 sec/ea. - 100ea products/tray, Magazine to Magazine
Vision System Top : 4M x 2 sets Bottom : 4M x 2 sets Option: 1. Barrel Side Inspection vision
  2. Iris inspection vision(Check assembled of not)
Pixel resolution 6.1um
FOV 12mm x 12mm
Light Multi-light system Designed by SD OPTICS
NG product Sorting
Tray loading 10 trays/magazine

Lens Flare Inspection System

- Lens top/bottom/side/inside of lens ass’y barrel- Iris inside of lens ass’y- Lens flare inspection- Auto NG Sorting system

Items SD Optics Remark
Min. Defect size
Detect defection
type
Flare
Underkill ≤ 0.6% - Base on mass production product 2,000ea
Overkill ≤ 6% - Not including +1 pixel size deviation, secondary
    contamination, Visual inspector error
Repeatability ≥ 95% - Not including less than 30 gray value defect
Cycle Time 2.3 sec/ea. - 100ea products/tray, Magazine to Magazine
Vision System Pre-focus vision 1 set Pre-align vision system
Pixel resolution Using customer’s Image sensor
FOV -
Light LED Array Designed by SD OPTICS
NG product Sorting
Tray loading 10 trays/magazine
  • Customer Image

  • Results Image

Lens Barrel Inspection System

- Barrel Top/Bottom/Side inspection, barrel inside inspection- PParticle, dent, scratch, contamination, coating error- Using the combination of multi illumination system

Items SD Optics Remark
Min. Defect size 20um Base on short side of defect
Detect defection
type
Particle, Dent, Scratch, Conramination,
Coating error
Inspection area : Barrel Top/Bottom/Side, Barrel inside
Underkill ≤ 1% - Base on mass production product 2,000ea
Overkill ≤ 6% - Not including ±1 pixel size deviation, secondary
    contamination, Visual inspector error
Repeatability ≥ 95% - Not including less than 30 gray value defect
Cycle Time 2.0 sec/ea. - 100ea products/tray, Magazine to Magazine
Vision System Bottom : 2M x 1 sets Side : 2M x 1 sets
Inside : 2M x 1 set Top : 4M x 2 sets (color)
Pixel resolution 7.6um
FOV 14mm x 14mm
Light Multi-light system Designed by SD OPTICS
NG product Sorting
Tray loading 10 trays/magazine

VCM-Lens Ass’y Inspection System

- IR Filter top/bottom & Lens top side inspection- Particle, black dot, white dot, bubble, scratch, contamination, coating error, bonding error- Using the combination of multi illumination system

Items SD Optics Remark
Min. Defect size ≥ 15 um
≥ 15 um
≥ 30 um
IR filter AR side
 IR filter AR side
 Lens top side
Detect defection
type
Particle, Black dot, White dot, Bubble, Scratch,
Contamination, Coating error, Bonding error
Inspection area : IR Filter Top/Bottom &
  Lens top side
Underkill ≤ 0.2% - Base on mass production product 2,000ea
Overkill ≤ 8% - Not including ±1 pixel size deviation, secondary
    contamination, Visual inspector error
Repeatability ≥ 95% - Not including less than 30 gray value defect
Cycle Time 0.9 sec/ea. - Base on dual line concept
Vision System 4M x 1 set
Pixel resolution 6.1um
FOV 12mm x 12mm
Light Multi-light system Designed by SD OPTICS
NG product Sorting
Tray loading 5 trays/magazine

Image Sensor Inspection System (Semi-auto)

- Effective area of image sensor inspection- Particle, contamination- Using the combination of multi illumination system

Items SD Optics Remark
Min. Defect size ≥ 1 um
Detect defection
type
Particle, contamination Image sensor effective area
Underkill ≤ 0.5% - Base on mass production product 2,000ea
Overkill ≤ 2% - Not including ±1 pixel size deviation, secondary
    contamination, Visual inspector error
Repeatability ≥ 97% - Not including less than 30 gray value defect
Cycle Time 1.5 sec/ea. - Excluding the Loading/Unloading time by operator
Vision System Top : 4M x 1 set
Pixel resolution 4.23um
FOV 10mm x 10mm
Light Multi-light system Designed by SD OPTICS
NG product Manual (Cleaning by operator) Using 20x Microscope
Tray loading 1 strip Manual

Camera Module Top Side Inspection System

- Top side of camera module inspection- Particle, scratch, contamination, poron shift, FPCB, Connector- Using the combination of multi illumination system

Items SD Optics Remark
Min. Defect size ≥ 50 um
≥ 150 um
Lens top
Poron, FPCB, connector
Detect defection
type
Particle, Scratch, Contamination
Poron shift, FPCB, Connector
Inspection area : Module top side
Underkill ≤ 0.25% - Base on mass production product 2,000ea
Overkill ≤ 5% - Not including ±1 pixel size deviation, secondary
    contamination, Visual inspector error
Repeatability ≥ 97% - Not including less than 30 gray value defect
Cycle Time 2.5 sec/ea. - Excluding the Loading/Unloading time by operator
Vision System Module top side : 4M x 2 sets
Pixel resolution 6.1 um / 11.4 um
FOV 12.5 x 12.5 / 23.2 x 23.2 (mm)
Light Multi-light system Designed by SD OPTICS
NG product Sorting
Tray loading 1 tray Loading/Unloading by operator

Camera Module 6-side Inspection System

- 6-surface of the camera module top/side/bottom inspection- Particle, scratch, contamination, poron shift, FPCB, Connector stiffener- Using the combination of multi illumination system

Items SD Optics Remark
Min. Defect size ≥ 50 um
≥ 50 um
Lens top side
Poron, FPCB, connector
Detect defection
type
Particle, Scratch, Contamination
Poron, FPCB, Connector stiffener
Inspection area : Module top/ Side/Bottom
Underkill ≤ 0.2% - Base on mass production product 2,000ea
Overkill ≤ 5% - Not including ±1 pixel size deviation, secondary
    contamination, Visual inspector error
Repeatability ≥ 97% - Not including less than 30 gray value defect
Cycle Time 2.1 sec/ea. - Base on Mass production product 5 LOTs (60 ea./Tray)
Vision System 5M x 9 sets Color camera
Pixel resolution 3.8 um / 5.8 um
FOV 9.3 x 7.9 / 16.2 x 13.7 (mm)
Light Multi-light system Designed by SD OPTICS
NG product Sorting
Tray loading Magazine
  • Chipping on Barrel

  • Damages on Connector

  • Lens Scratch

  • Dent on Shield can

  • Lack of epoxy

Bar Type Flash Lens Inspection System

- Bar type flash lens top/bottom side inspection- Particle, black dot, white dot, scratch, contamination- Auto NG sorting system

Items SD Optics Remark
Min. Defect size ≥ 30 um Base on short side of defect
Detect defection
type
Particle, Black dot, White dot,
Scratch, Contamination
Inspection area : Lens Top, Bottom
Underkill ≤ 0.5% - Base on mass production product 2,000ea
Overkill ≤ 2% - Not including ±1 pixel size deviation, secondary
    contamination, Visual inspector error
Repeatability ≥ 97% - Not including less than 30 gray value defect
Cycle Time 1.2 sec/ea. - 32ea products/tray
 - Dual line concept
Vision System Top: 4M x 2 sets Bottom: 4M x 2 sets
Pixel resolution 6.1 um
FOV 12mm x 12mm
Light Multi-light system Designed by SD OPTICS
NG product Sorting
Tray loading Stack 40 tray at once

Single Type Flash Lens Inspection System

- Single type flash lens top/bottom and side inspection- Particle, black dot, white dot, scratch, contamination- Using the combination of multi illumination system

Items SD Optics Remark
Min. Defect size ≥ 30 um Base on short side of defect
Detect defection
type
Particle, Black dot, White dot,
Scratch, Contamination
Inspection area : Lens Top, Bottom, Side
Underkill ≤ 0.5% - Base on mass production product 2,000ea
Overkill ≤ 3% - Not including ±1 pixel size deviation, secondary
    contamination, Visual inspector error
Repeatability ≥ 95% - Not including less than 30 gray value defect
Cycle Time 1.3 sec/ea. - 60ea products/tray
Vision System Top: 4M x 2 sets
Bottom: 4M x 2 sets
Side: 4M x 2 sets
Pixel resolution 6.1 um
FOV 12mm x 12mm
Light Multi-light system Designed by SD OPTICS
NG product Sorting
Tray loading Stack 40 tray at once

VR/AR Lens Inspection System

- Single type flash lens top/bottom and side inspection- Particle, black dot, white dot, bubble, scratch, contamination- Using the combination of multi illumination system- Auto NG sorting

Items SD Optics Remark
Min. Defect size ≤ 50um
Detect defection
type
Particle, Black dot, White dot, Bubble, Scratch,
Contamination
Inspection area : Lens top/bottom
Underkill ≤ 0.5% - Base on mass production product 2,000ea
Overkill ≤ 3% - Not including +1 pixel size deviation, secondary
    contamination, Visual inspector error
Repeatability ≥ 95% - Not including less than 30 gray value defect
Cycle Time 4sec/ea - 1 lens/tray
Vision System Top : 25M x 2 sets Bottom : 25M x 1 sets
Pixel resolution 13.1um
FOV 60mm x 60mm
Light Multi-light system Designed by SD OPTICS
NG product Sorting
Tray loading Stack

Wire Bonding Vision Inspection System

1. Outline      Poor detection before, after and after wire bonding in module2. Inspection Items ( Selectable by customer )     - Bumped Ball size, Ball Interval     - Ball to Edge Interval length , scratch, Chipping, Defect3. Defective articles Marking / Mapping

Items SD Optics Remark
Min. Defect size 5um Base on short side of defect
Detect defection
type
Bumped Ball size, Ball Interval,
Ball to Edge Interval length,
scratch, Chipping, Defect
Underkill ≤ 1% - Base on mass production product 2,000ea
Overkill ≤ 6% - Not including +1 pixel size deviation, secondary
    contamination, Visual inspector error
Repeatability ≥ 95% - Not including less than 30 gray value defect
Cycle Time 0.75sec/ea
Vision System Top : 4M 2set Base on dual line concept
Pixel resolution 1.6um
FOV 3.2mm x 3.2mm
Light Multi-light system Designed by SD OPTICS
NG product Laser Marking
Tray loading Magazine

Multifunctional Precision Measuring System

- Live 3D visual display - Auto-Focus, Multi focus, AIF Image function - User friendly measuring SW package .Lighting control for each illuminations .Create and edit measuring program .Auto-measuring execute programed items .Measured results data management

Items SD Optics Remark
Stage moving range 500 x 350 x 100 XYZ, mm
WS Magnification 1.3 x
FOV (mm) 8.5 x 8.5
Scanning Depth 6.1 mm
Depth Resolution 19.2 um
Accuracy ± 10 um
Illumination 24 sector control system SD in-house made

LCD Driver IC (Chip On Glass)Inspection System

- Acquisition High precision color image based on In-Focus color image- Acquisition of three illuminations images at the same location- Real-time Focusing Ability for LDI Inspection Surface

Items Description Remark
Product COG Upgrade
Size / Weight 1,640(W) x 1,300(D) x 2,360(H), 1.5 ton
Min. Defect Size 6μm
UPH ≥ 6,000 UPH (4” tray, 3x33 array, Dual
Illumination, defect rate 3%)
≥ 3,700 UPH (2” tray, 2x20 array, Dual
Illumination, defect rate 3%)
Detectability Underkill ≤ 0.1%
Overkill ≤ 1%
Repeatability ≥ 95%

Dark area inspection

Coaxial Illumination

Bump illumination

Multi illumination

Mobile Display DefectMeasuring System

- Precision measuring defects in the interlayer of flat or curved display

Items Spec Remark
WS Magnification 7.5 x
FOV (mm) 2.3 x 2.2
Scanning Depth 0.688mm
Depth Resolution 2.15um
Accuracy ± 5um Scanning range 1.45mm
Measuring T/T 84 sec / 120 cut

Material(defect) transparency

Defect on Curved Surface

Mobile Display Micro CrackInspection System

- Detection of micro crack on the flat and curved display

Items Spec Remark
WS Magnification 2.3 x
FOV (mm) 5.5 x 5.5
Scanning Depth 4.9mm
Depth Resolution 15.5um
Accuracy ± 6um Scanning range 1.45mm
Measuring T/T - Depends on the required insp. spec

Detection of the crack on the curved surface