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光学及视觉检查设备

外观检测设备(AVI)

SD Optics 通过采用自主研发的核心技术与多年来的丰富经验,提供多项外观检测解决方案,准确地检测出不同类型的不良。检测对象包括摄像头单镜片,组装镜片,VCM,镜筒,图像传感器以及各种闪光及杂光镜片,适用于整条手机摄像头模组各组件的生产工序。结合自主研发的照明系统,高效率HW设计,SW及算法程序以及优质的售后服务,为客户提供最佳外观检测方案。

SD Optics 通过采用自主研发的核心技术与多年来的丰富经验,提供多项外观检测解决方案,准确地检测出不同类型的不良。检测对象包括摄像头单镜片,组装镜片,VCM,镜筒,图像传感器以及各种闪光及杂光镜片,适用于整条手机摄像头模组各组件的生产工序。结合自主研发的照明系统,高效率HW设计,SW及算法程序以及优质的售后服务,为客户提供最佳外观检测方案。

单镜片外观检测

- Lens top/bottom side inspection- Particle, black/white dot, bubble, scratch, contamination, coating error inspection- Using the combination of multi illumination system

组装镜片外观检测

- Lens top/bottom side, Barrel inspection- Particle, black/white dot, bubble, scratch, contamination, coating error inspection- Auto NG Sorting system

镜片杂光检测

- Lens top/bottom/side/inside of lens ass’y barrel- Iris inside of lens ass’y- Lens flare inspection- Auto NG Sorting system

  • Customer Image

  • Results Image

镜筒检测

- Barrel Top/Bottom/Side inspection, barrel inside inspection- PParticle, dent, scratch, contamination, coating error- Using the combination of multi illumination system

VCM 检测

- IR Filter top/bottom & Lens top side inspection- Particle, black dot, white dot, bubble, scratch, contamination, coating error, bonding error- Using the combination of multi illumination system

图像传感器异物检测

- Effective area of image sensor inspection- Particle, contamination- Using the combination of multi illumination system

摄像头模组检测

- Top side of camera module inspection- Particle, scratch, contamination, poron shift, FPCB, Connector- Using the combination of multi illumination system

摄像头模组六面检测

- 6-surface of the camera module top/side/bottom inspection- Particle, scratch, contamination, poron shift, FPCB, Connector stiffener- Using the combination of multi illumination system

  • Chipping on Barrel

  • Damages on Connector

  • Lens Scratch

  • Dent on Shield can

  • Lack of epoxy

Bar-type 闪光镜片检测

- Bar type flash lens top/bottom side inspection- Particle, black dot, white dot, scratch, contamination- Auto NG sorting system

闪光镜片检测

- Single type flash lens top/bottom and side inspection- Particle, black dot, white dot, scratch, contamination- Using the combination of multi illumination system

VR/AR 镜片检测

- Single type flash lens top/bottom and side inspection- Particle, black dot, white dot, bubble, scratch, contamination- Using the combination of multi illumination system- Auto NG sorting

金线焊接检测

1. Outline      Poor detection before, after and after wire bonding in module2. Inspection Items ( Selectable by customer )     - Bumped Ball size, Ball Interval     - Ball to Edge Interval length , scratch, Chipping, Defect3. Defective articles Marking / Mapping

非接触式3D多功能量测

- Live 3D visual display - Auto-Focus, Multi focus, AIF Image function - User friendly measuring SW package .Lighting control for each illuminations .Create and edit measuring program .Auto-measuring execute programed items .Measured results data management